Invention Grant
US08854059B2 Embedded SAR based active gain capacitance measurement system and method
有权
基于嵌入式SAR的有源增益电容测量系统及方法
- Patent Title: Embedded SAR based active gain capacitance measurement system and method
- Patent Title (中): 基于嵌入式SAR的有源增益电容测量系统及方法
-
Application No.: US13194605Application Date: 2011-07-29
-
Publication No.: US08854059B2Publication Date: 2014-10-07
- Inventor: Ronald F. Cormier, Jr.
- Applicant: Ronald F. Cormier, Jr.
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Alan A. R. Cooper; Frederick J. Telecky, Jr.
- Main IPC: G01R27/26
- IPC: G01R27/26 ; H03K17/96 ; G06F3/045 ; G06F3/044 ; G01D15/00 ; G01D1/00 ; G01D21/00
Abstract:
A system for measuring a capacitor (CSENj) precharges a CDAC (23) in a SAR converter (17) to a reference voltage (VAZ) and also precharges a first terminal (3-j) of the capacitor to another reference voltage (GND). During a measurement phase, the CDAC is coupled between an output and an input of an amplifier (31) and the capacitor also is coupled to the input of the amplifier, so as to redistribute charge between the capacitor and the CDAC. The amplifier generates an output voltage (VAMP) representing the capacitance being measured. The output voltage is stored in the CDAC. The SAR converter converts the output voltage to a digital value representing the capacitance being measured.
Public/Granted literature
- US20110279170A1 EMBEDDED SAR BASED ACTIVE GAIN CAPACITANCE MEASUREMENT SYSTEM AND METHOD Public/Granted day:2011-11-17
Information query
