Invention Grant
- Patent Title: Touch sensing method and apparatus
- Patent Title (中): 触摸感应方法和装置
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Application No.: US13184292Application Date: 2011-07-15
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Publication No.: US08854064B2Publication Date: 2014-10-07
- Inventor: Sualp Aras , Tatsuyuki Nihei , Abidur Rahman
- Applicant: Sualp Aras , Tatsuyuki Nihei , Abidur Rahman
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent John J. Patti; Frederick J. Telecky, Jr.
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G01R27/28 ; G06F3/041 ; G01F7/00 ; H03M11/02 ; H03M3/00 ; G01D5/24 ; G06F3/044 ; G01P15/125

Abstract:
A method for measuring for generating a touch capacitance measurement is provided. Gain and offset control signals are generated, where the gain and offset control signals are adjusted to compensate for base capacitance of a touch sensor. The gain control signal is applied to a touch sensor during a first phase of a clock signal, and the offset control signal is applied to an output circuit during a second phase of the clock signal. The output circuit is coupled to the touch sensor during the second phase of the clock signal. The touch capacitance measurement is generated by compensating for the base capacitance with the gain and offset control signals, and a gain is applied to the touch capacitance measurement.
Public/Granted literature
- US20130015867A1 TOUCH SENSING METHOD AND APPARATUS Public/Granted day:2013-01-17
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