Invention Grant
- Patent Title: Single event transient direct measurement methodology and circuit
- Patent Title (中): 单事件瞬态直接测量方法和电路
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Application No.: US13549225Application Date: 2012-07-13
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Publication No.: US08854076B2Publication Date: 2014-10-07
- Inventor: Radu Dumitru , Harry Gardner
- Applicant: Radu Dumitru , Harry Gardner
- Applicant Address: US CO Colorado Springs
- Assignee: Aeroflex Colorado Springs Inc.
- Current Assignee: Aeroflex Colorado Springs Inc.
- Current Assignee Address: US CO Colorado Springs
- Agency: Hogan Lovells US LLP
- Agent Peter J. Meza
- Main IPC: H03K19/00
- IPC: H03K19/00
Abstract:
A circuit and method of directly measuring the Single Event Transient (SET) performance of a combinatorial circuit includes a measurement chain. The measurement chain includes a plurality of cells, each in turn including a pair of SR latches, a dual-input inverter, and a target. During measurement and testing, the targets are irradiated, and a pulse signal caused by an SET event is allowed to propagate through the measurement chain only if the pair of SR latches are active at the same time. The pulse signal is latched by the measurement chain, thus allowing the presence of an SET event to be detected.
Public/Granted literature
- US20120274352A1 SINGLE EVENT TRANSIENT DIRECT MEASUREMENT METHODOLOGY AND CIRCUIT Public/Granted day:2012-11-01
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