Invention Grant
- Patent Title: Error detection in nonvolatile logic arrays using parity
- Patent Title (中): 使用奇偶校验的非易失性逻辑阵列中的错误检测
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Application No.: US13753856Application Date: 2013-01-30
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Publication No.: US08854079B2Publication Date: 2014-10-07
- Inventor: Steven Craig Bartling , Sudhanshu Khanna
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Frederick J. Telecky, Jr.
- Main IPC: H03K19/177
- IPC: H03K19/177 ; G06F7/00 ; H03K19/173

Abstract:
A system on chip (SoC) has a nonvolatile memory array of n rows by m columns coupled to one or more of the core logic blocks. M is constrained to be an odd number. Each time a row of m data bits is written, parity is calculated using the m data bits. Before storing the parity bit, it is inverted. Each time a row is read, parity is checked to determine if a parity error is present in the recovered data bits. A boot operation is performed on the SoC when a parity error is detected.
Public/Granted literature
- US20140210511A1 Error Detection in Nonvolatile Logic Arrays Using Parity Public/Granted day:2014-07-31
Information query
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