Invention Grant
- Patent Title: Sample measuring device and sample measuring system
- Patent Title (中): 样品测量装置和样品测量系统
-
Application No.: US13458694Application Date: 2012-04-27
-
Publication No.: US08854206B2Publication Date: 2014-10-07
- Inventor: Akinori Kai , Atsushi Wada
- Applicant: Akinori Kai , Atsushi Wada
- Applicant Address: JP Kyoto
- Assignee: ARKRAY, Inc.
- Current Assignee: ARKRAY, Inc.
- Current Assignee Address: JP Kyoto
- Agency: Studebaker & Brackett PC
- Priority: JP2011-100409 20110428
- Main IPC: G08B1/08
- IPC: G08B1/08 ; A61B5/00 ; A61B5/145

Abstract:
A sample measuring device according to the present invention includes a measuring unit for performing measurement with respect to a particular component contained in a sample, a measurement data storage unit for storing measurement data obtained by the measuring unit, a display unit for displaying the measurement data, a sensor strip detector for detecting insertion and removal of a sensor strip to which the sample is applied, and a first data transmitter/receiver for transmitting the measurement data via wireless communication. The first data transmitter/receiver performs initial authentication process for wireless communication after insertion of the sensor strip is detected by the sensor strip detector.
Public/Granted literature
- US20120274443A1 SAMPLE MEASURING DEVICE AND SAMPLE MEASURING SYSTEM Public/Granted day:2012-11-01
Information query