Invention Grant
US08854450B2 Alignment method for assembling substrates in different spaces without fiducial mark and its system
有权
用于在不具有基准标记的不同空间中组装基板的对准方法及其系统
- Patent Title: Alignment method for assembling substrates in different spaces without fiducial mark and its system
- Patent Title (中): 用于在不具有基准标记的不同空间中组装基板的对准方法及其系统
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Application No.: US13352302Application Date: 2012-01-17
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Publication No.: US08854450B2Publication Date: 2014-10-07
- Inventor: Chorng-tyan Lin , Chih-chin Wen , Chun-ming Yang , Jwu-jiun Yang
- Applicant: Chorng-tyan Lin , Chih-chin Wen , Chun-ming Yang , Jwu-jiun Yang
- Applicant Address: TW Kaohsiung
- Assignee: Metal Industries Research & Development Centre
- Current Assignee: Metal Industries Research & Development Centre
- Current Assignee Address: TW Kaohsiung
- Agent Cheng-Ju Chiang
- Priority: TW100145344A 20111208
- Main IPC: H04N7/18
- IPC: H04N7/18

Abstract:
An alignment method for assembling substrates in different spaces without fiducial mark and its system are provided, and the alignment method has steps of: pre-defining partially standard character regions of two substrates; capturing at least two partially actual images of two substrates in different waiting spaces, respectively; comparing to obtain at least two partially actual character regions of the two substrates, respectively; building actual coordinate systems of the two substrates, respectively; comparing the actual coordinate systems of the two substrates with each other to obtain a set of offset values; moving the two substrates from the different waiting spaces to an alignment-and-installation space based on the set of offset values and a predetermined movement value, respectively; and stacking the two substrates with each other to finish the alignment and installation in the alignment-and-installation space.
Public/Granted literature
- US20130147942A1 ALIGNMENT METHOD FOR ASSEMBLING SUBSTRATES IN DIFFERENT SPACES WITHOUT FIDUCIAL MARK AND ITS SYSTEM Public/Granted day:2013-06-13
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