Invention Grant
US08854610B2 Apparatus and method for measuring a three-dimensional shape 有权
用于测量三维形状的装置和方法

Apparatus and method for measuring a three-dimensional shape
Abstract:
Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.
Public/Granted literature
Information query
Patent Agency Ranking
0/0