Invention Grant
- Patent Title: Position-measuring device
- Patent Title (中): 位置测量装置
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Application No.: US13203688Application Date: 2010-02-03
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Publication No.: US08854630B2Publication Date: 2014-10-07
- Inventor: Ulrich Benner
- Applicant: Ulrich Benner
- Applicant Address: DE Traunreut
- Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee Address: DE Traunreut
- Agency: Kenyon & Kenyon LLP
- Priority: DE102009001262 20090302
- International Application: PCT/EP2010/051290 WO 20100203
- International Announcement: WO2011/044027 WO 20110414
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G01B11/00 ; G01D5/347
Abstract:
A position-measuring device is suited for detecting the relative position of a scanning unit and a reflection measuring grating movable relative thereto in at least one measuring direction. The scanning unit includes a primary light source as well as at least one detector assembly in a detection plane. A periodic configuration of point light sources is able to be generated in the detection plane from the primary light source. The primary light source is disposed above the detection plane.
Public/Granted literature
- US20120081711A1 Position-Measuring Device Public/Granted day:2012-04-05
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