Invention Grant
- Patent Title: Method of operating semiconductor device
- Patent Title (中): 操作半导体器件的方法
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Application No.: US13542401Application Date: 2012-07-05
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Publication No.: US08854891B2Publication Date: 2014-10-07
- Inventor: Seiichi Aritome
- Applicant: Seiichi Aritome
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: William Park & Associates Patent Ltd.
- Priority: KR10-2011-0067013 20110706; KR10-2012-0068544 20120626
- Main IPC: G11C16/10
- IPC: G11C16/10

Abstract:
A semiconductor device is operated by, inter alia: programming selected memory cells by applying a first program voltage which is increased by a first step voltage to a selected word line and by applying a first pass voltage having a constant level to unselected word lines, and when a voltage difference between the first program voltage and the first pass voltage reaches a predetermined voltage difference, programming the selected memory cells by applying a second program voltage which is increased by a second step voltage lower than the first step voltage to the selected word line and by applying a second pass voltage which is increased in proportion to the second program voltage to first unselected word lines adjacent to the selected word line among the unselected word lines.
Public/Granted literature
- US20130010548A1 METHOD OF OPERATING SEMICONDUCTOR DEVICE Public/Granted day:2013-01-10
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