Invention Grant
US08854898B2 Apparatuses and methods for comparing a current representative of a number of failing memory cells 有权
用于比较多个故障存储器单元的当前代表的装置和方法

Apparatuses and methods for comparing a current representative of a number of failing memory cells
Abstract:
Apparatuses and methods for comparing a sense current representative of a number of failing memory cells of a group of memory cells and a reference current representative of a reference number of failing memory cells is provided. One such apparatus includes a comparator configured to receive the sense current and to receive the reference current. The comparator includes a sense current buffer configured to buffer the sense current and the comparator is further configured to provide an output signal having a logic level indicative of a result of the comparison.
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