A random access memory includes a plurality of memories configured to store and provide data, and a test module coupled to the plurality of memories, wherein the test module is configured to write a first write data pattern into at last a first portion of the plurality of memories in response to a data pattern value, wherein the test module is configured to read a read data pattern from the plurality of memories, wherein the test module is configured to compare the first write data pattern to the read data pattern, and wherein the test module is configured to report errors in response to a comparison of the write data pattern to the read data pattern.