Invention Grant
US08855181B2 Method and system for compensating a delay mismatch between a first measurement channel and a second measurement channel
有权
用于补偿第一测量通道和第二测量通道之间的延迟失配的方法和系统
- Patent Title: Method and system for compensating a delay mismatch between a first measurement channel and a second measurement channel
- Patent Title (中): 用于补偿第一测量通道和第二测量通道之间的延迟失配的方法和系统
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Application No.: US13760198Application Date: 2013-02-06
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Publication No.: US08855181B2Publication Date: 2014-10-07
- Inventor: Jens Barrenscheen
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Eschweiler & Associates, LLC
- Main IPC: H04L12/26
- IPC: H04L12/26 ; H04L7/00 ; H03M1/12 ; H02P27/08

Abstract:
A method and a system for compensating a delay mismatch between a first measurement channel and a second measurement channel is disclosed. A method for compensating a delay mismatch between a first measurement channel and a second measurement channel includes providing a reference point for starting the first and second measurement channel, and starting the first measurement channel after expiration of a first delay period which begins at the reference point. The method further includes starting the second measurement channel after expiry of a second delay period which begins at the reference point, wherein a difference between a length of the first delay period and a length of the second delay period is substantially equal to the delay mismatch between the first measurement channel and the second measurement channel.
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