Invention Grant
- Patent Title: Correction method for differential phase contrast imaging
- Patent Title (中): 差分相位成像校正方法
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Application No.: US13319527Application Date: 2010-06-10
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Publication No.: US08855265B2Publication Date: 2014-10-07
- Inventor: Klaus Juergen Engel , Dieter Geller , Gereon Vogtmeier
- Applicant: Klaus Juergen Engel , Dieter Geller , Gereon Vogtmeier
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP09162764 20090616
- International Application: PCT/IB2010/052577 WO 20100610
- International Announcement: WO2010/146503 WO 20101223
- Main IPC: G03H5/00
- IPC: G03H5/00 ; A61B6/00 ; G21K1/06 ; G01N23/04

Abstract:
The present invention generally refers to a correction method for grating-based X-ray differential phase contrast imaging (DPCI) as well as to an apparatus which can advantageously be applied in X-ray radiography and tomography for hard X-ray DPCI of a sample object or an anatomical region of interest to be scanned. More precisely, the proposed invention provides a suitable approach that helps to enhance the image quality of an acquired X-ray image which is affected by phase wrapping, e.g. in the resulting Moiré interference pattern of an emitted X-ray beam in the detector plane of a Talbot-Lau type interferometer after diffracting said X-ray beam at a phase-shifting beam splitter grating. This problem, which is further aggravated by noise in the obtained DPCI images, occurs if the phase between two adjacent pixels in the detected X-ray image varies by more than π radians and is effected by a line integration over the object's local phase gradient, which induces a phase offset error of π radians that leads to prominent line artifacts parallel to the direction of said line integration.
Public/Granted literature
- US20120099702A1 CORRECTION METHOD FOR DIFFERENTIAL PHASE CONTRAST IMAGING Public/Granted day:2012-04-26
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