Invention Grant
- Patent Title: Ultrasound examination apparatus and ultrasound examination method using laser light to detect microscopic displacement caused by reflected ultrasonic waves
- Patent Title (中): 超声波检查仪器和超声检查方法采用激光检测由反射超声波引起的微观位移
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Application No.: US13523930Application Date: 2012-06-15
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Publication No.: US08855739B2Publication Date: 2014-10-07
- Inventor: Takayuki Nagata , Shinichi Kadowaki
- Applicant: Takayuki Nagata , Shinichi Kadowaki
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2010-236169 20101021
- Main IPC: A61B5/05
- IPC: A61B5/05 ; A61B5/00 ; A61B8/00 ; A61B8/08 ; A61B8/14

Abstract:
The ultrasound examination apparatus according to an exemplary embodiment of the present disclosure is an ultrasound examination apparatus for observing an inside of a body of a living subject and includes: a transmitting probe that transmits ultrasonic waves to an inside of an examination target which is a part of the living subject; a receiving probe that detects microscopic displacement on a surface of the examination target without contact with the examination target, to detect reflected ultrasonic waves which are the to ultrasonic waves reflected from the inside of the examination target; and a signal processing unit that generates an image of the inside of the examination target, based on the reflected ultrasonic waves during a scanning operation in which the transmitting probe is kept fixed with respect to the examination target and the receiving probe is moved with respect to the examination target.
Public/Granted literature
- US20120253196A1 ULTRASOUND EXAMINATION APPARATUS AND ULTRASOUND EXAMINATION METHOD Public/Granted day:2012-10-04
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