Invention Grant
US08855750B2 Optical three-dimensional structure measuring device and structure information processing method therefor 有权
光学三维结构测量装置及其结构信息处理方法

  • Patent Title: Optical three-dimensional structure measuring device and structure information processing method therefor
  • Patent Title (中): 光学三维结构测量装置及其结构信息处理方法
  • Application No.: US13257573
    Application Date: 2010-03-03
  • Publication No.: US08855750B2
    Publication Date: 2014-10-07
  • Inventor: Yuichi Teramura
  • Applicant: Yuichi Teramura
  • Applicant Address: JP Tokyo
  • Assignee: Topcon Corporation
  • Current Assignee: Topcon Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: McGinn IP Law Group, PLLC
  • Priority: JP2009-068557 20090319
  • International Application: PCT/JP2010/053398 WO 20100303
  • International Announcement: WO2010/106913 WO 20100923
  • Main IPC: A61B5/00
  • IPC: A61B5/00 G01B9/02 A61B3/00 A61B3/10 G01N21/47
Optical three-dimensional structure measuring device and structure information processing method therefor
Abstract:
An optical three-dimensional structure measuring device including: optical three-dimensional structure information storing device (91) for storing optical three-dimensional structure information; specific layer extracting device (121) for comparing information values of the optical three-dimensional structure information stored in the optical three-dimensional structure information storing device with a predetermined threshold and extracting, as a specific layer area of the measurement target, an area equal to or greater than a predetermined range where the information values of the optical three-dimensional structure information equal to or greater than the predetermined threshold continue; missing area extracting device (122) for extracting, as missing areas, areas where the information values of the optical three-dimensional structure information are smaller than the predetermined threshold in the specific layer area; missing area range calculating device (123) for calculating sizes of ranges of the missing areas; and region-of-interest classifying device (124) for comparing the sizes of the ranges of the missing areas with a plurality of predetermined range determination reference values and classifying the missing areas into a plurality of types of regions of interest.
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