The present invention addresses the deficiencies of the art in respect to the manufacturing test processes and provides a novel and non-obvious method, system and apparatus for dynamic optimization of manufacturing test coverage with automated integration of field failure feedback with the order configurator. In one embodiment of the invention, a manufacturing field failure feedback method can be provided. The method can include retrieving field failure data, analyzing the field failure data, storing failure analysis object information, modifying a manufacturing test case selection within the test case selection and order configurator based on using field failure data analysis, the test case selection including rules for test case selection and test case object information, and configuring a testing order with an optimized test case selection.