Invention Grant
- Patent Title: Analysis device and simulation method
- Patent Title (中): 分析装置和模拟方法
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Application No.: US13366931Application Date: 2012-02-06
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Publication No.: US08855982B2Publication Date: 2014-10-07
- Inventor: Yoshitaka Ohnishi
- Applicant: Yoshitaka Ohnishi
- Applicant Address: JP Tokyo
- Assignee: Sumitomo Heavy Industries, Ltd.
- Current Assignee: Sumitomo Heavy Industries, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Squire Patton Boggs (US) LLP
- Main IPC: G06G7/48
- IPC: G06G7/48 ; B05C5/00 ; C03B37/018

Abstract:
An analysis device that analyzes an object with a predetermined shape is provided which includes a pre-positioned creation unit that creates a system including a plurality of particles, a region specifying unit that specifies a region with the predetermined shape in the system created by the pre-positioned creation unit as a system describing the object, and a numerical calculation unit that numerically calculates a governing equation governing motions of particles in the system describing the object.
Public/Granted literature
- US20130204589A1 ANALYSIS DEVICE AND SIMULATION METHOD Public/Granted day:2013-08-08
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