发明授权
- 专利标题: Analysis device and simulation method
- 专利标题(中): 分析装置和模拟方法
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申请号: US13366931申请日: 2012-02-06
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公开(公告)号: US08855982B2公开(公告)日: 2014-10-07
- 发明人: Yoshitaka Ohnishi
- 申请人: Yoshitaka Ohnishi
- 申请人地址: JP Tokyo
- 专利权人: Sumitomo Heavy Industries, Ltd.
- 当前专利权人: Sumitomo Heavy Industries, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Squire Patton Boggs (US) LLP
- 主分类号: G06G7/48
- IPC分类号: G06G7/48 ; B05C5/00 ; C03B37/018
摘要:
An analysis device that analyzes an object with a predetermined shape is provided which includes a pre-positioned creation unit that creates a system including a plurality of particles, a region specifying unit that specifies a region with the predetermined shape in the system created by the pre-positioned creation unit as a system describing the object, and a numerical calculation unit that numerically calculates a governing equation governing motions of particles in the system describing the object.
公开/授权文献
- US20130204589A1 ANALYSIS DEVICE AND SIMULATION METHOD 公开/授权日:2013-08-08
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