Invention Grant
- Patent Title: Method and system for assessing environmental impact of a processing device
- Patent Title (中): 评估处理装置的环境影响的方法和系统
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Application No.: US13271756Application Date: 2011-10-12
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Publication No.: US08855991B2Publication Date: 2014-10-07
- Inventor: Fritz F. Ebner
- Applicant: Fritz F. Ebner
- Applicant Address: US CT Norwalk
- Assignee: Xerox Corporation
- Current Assignee: Xerox Corporation
- Current Assignee Address: US CT Norwalk
- Agency: Fox Rothschild LLP
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06G7/62 ; G06Q10/00

Abstract:
Methods and systems for assessing the environmental impact of one or more processing devices, such one or more printers, are disclosed. The system queries a life cycle assessment (LCA) service to receive a life cycle phase model for each device. The life cycle phase model includes a set of consumption variable categories associated with potential device usage during a life cycle phase. The system then receives consumption data for the device, identifies a portion of the consumption data that corresponds to the consumption variable categories in the model, and obtains an assessment of environmental impact of the device during the life cycle phase based on the consumption data.
Public/Granted literature
- US20130096893A1 METHOD AND SYSTEM FOR ASSESSING ENVIRONMENTAL IMPACT OF A PROCESSING DEVICE Public/Granted day:2013-04-18
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