Invention Grant
- Patent Title: Debugging apparatus and method
- Patent Title (中): 调试装置和方法
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Application No.: US13079275Application Date: 2011-04-04
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Publication No.: US08856596B2Publication Date: 2014-10-07
- Inventor: Jin-Seok Lee , Bernhard Egger , Dong-Hoon Yoo , Tai-Song Jin
- Applicant: Jin-Seok Lee , Bernhard Egger , Dong-Hoon Yoo , Tai-Song Jin
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR10-2010-0098404 20101008
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F9/30 ; G06F11/36

Abstract:
A debugging apparatus and method are provided. The debugging apparatus may include a breakpoint setting unit configured to store a first instruction corresponding to a breakpoint in a table, stop a program currently being executed, and insert a breakpoint instruction including current location information of the first instruction into the breakpoint; and an instruction execution unit configured to selectively execute one of the breakpoint instruction and the first instruction according to a value of a status bit.
Public/Granted literature
- US20120089821A1 DEBUGGING APPARATUS AND METHOD Public/Granted day:2012-04-12
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