Invention Grant
- Patent Title: Multi-tier field-programmable gate array hardware requirements assessment and verification for airborne electronic systems
- Patent Title (中): 机载电子系统的多层现场可编程门阵列硬件要求评估和验证
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Application No.: US13940863Application Date: 2013-07-12
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Publication No.: US08856708B1Publication Date: 2014-10-07
- Inventor: Kirk A. Lillestolen
- Applicant: Hamilton Sundstrand Corporation
- Applicant Address: US CT Windsor Locks
- Assignee: Hamilton Sundstrand Corporation
- Current Assignee: Hamilton Sundstrand Corporation
- Current Assignee Address: US CT Windsor Locks
- Agency: Kinney & Lange, P.A.
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
A method of verifying a field programmable gate array for use in an integrated system includes selecting, from a set of requirements of the field programmable gate array, a first subset of the requirements that are not influenced by dynamics of the integrated system; selecting, from the set of requirements of the field programmable gate array, a second subset of the requirements that are influenced by the dynamics of the integrated system; executing a hardware test on the field programmable gate array using a chip tester that verifies the first subset of the requirements; and executing a hardware test on the field programmable gate array to verify the second subset of the requirements while the field programmable gate array is installed within the integrated system.
Information query
