Invention Grant
US08856712B2 Optimized flip-flop device with standard and high threshold voltage MOS devices
有权
具有标准和高阈值电压MOS器件的优化触发器器件
- Patent Title: Optimized flip-flop device with standard and high threshold voltage MOS devices
- Patent Title (中): 具有标准和高阈值电压MOS器件的优化触发器器件
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Application No.: US13659253Application Date: 2012-10-24
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Publication No.: US08856712B2Publication Date: 2014-10-07
- Inventor: Deepak Pancholi , Srikanth Bojja , Bhavin Odedara
- Applicant: SanDisk Technologies Inc.
- Applicant Address: US TX Plano
- Assignee: SanDisk Technologies Inc.
- Current Assignee: SanDisk Technologies Inc.
- Current Assignee Address: US TX Plano
- Agency: Brinks Gilson & Lione
- Priority: IN3354/CHE/2012 20120813
- Main IPC: G06F17/50
- IPC: G06F17/50 ; H03K19/00 ; H01L25/00 ; H03K19/003 ; H03K19/177 ; H03K19/0175

Abstract:
A flip-flop operating with standard threshold voltage MOS devices as compared with high threshold voltage MOS devices may have improved speed performance, but greater leakage current. Likewise, a flip-flop operating with high threshold voltage MOS devices may reduce the leakage current and have better power efficiency, but decreased speed and performance. An optimized flip-flop may include a combination of standard threshold voltage MOS devices and high threshold voltage MOS devices. The optimized flip-flop may have less leakage during stand-by mode as compared to a flip-flop with standard threshold voltage MOS devices. In addition, the optimized flip-flop may have better performance and speed as compared to a flip-flop with high threshold voltage MOS devices.
Public/Granted literature
- US20140043078A1 OPTIMIZED FLIP-FLOP DEVICE WITH STANDARD AND HIGH THRESHOLD VOLTAGE MOS DEVICES Public/Granted day:2014-02-13
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