Invention Grant
- Patent Title: Method for circuit simulation
- Patent Title (中): 电路仿真方法
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Application No.: US13616511Application Date: 2012-09-14
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Publication No.: US08856719B2Publication Date: 2014-10-07
- Inventor: Seonguk Min , Sangho Park , Yeoil Yun
- Applicant: Seonguk Min , Sangho Park , Yeoil Yun
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2011-0099919 20110930
- Main IPC: G06F11/22
- IPC: G06F11/22 ; G06F17/50
Abstract:
A circuit simulation method for checking a circuit error is disclosed. The method may include generating a netlist with respect to a designed circuit, simulating an operation of the designed circuit using the generated netlist, and checking an error of the designed circuit using the generated netlist and using a waveform generated when performing the simulation.
Public/Granted literature
- US20130086539A1 METHOD FOR CIRCUIT SIMULATION Public/Granted day:2013-04-04
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