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US08861271B1 High reliability non-volatile static random access memory devices, methods and systems 有权
高可靠性非易失性静态随机存取存储器件,方法与系统

High reliability non-volatile static random access memory devices, methods and systems
摘要:
A device can include a plurality of memory cells, each memory cell including at least one latch circuit coupled between two data nodes, a first nonvolatile section coupled to a first data node, and a second nonvolatile section coupled to a second data node; and each nonvolatile section including at least one switch element in series with a programmable nonvolatile element, the switch element configured to couple the nonvolatile element to the corresponding data node during a high reliability read operation of the memory cell.
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