Invention Grant
- Patent Title: Constraining traces in formal verification
- Patent Title (中): 约束痕迹在形式验证
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Application No.: US12961389Application Date: 2010-12-06
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Publication No.: US08863049B1Publication Date: 2014-10-14
- Inventor: Lars Lundgren , Ziyad Hanna , Chung-Wah Norris Ip , Kathryn Drews Kranen , Lawrence Loh
- Applicant: Lars Lundgren , Ziyad Hanna , Chung-Wah Norris Ip , Kathryn Drews Kranen , Lawrence Loh
- Applicant Address: US CA Mountain View
- Assignee: Jasper Design Automation, Inc.
- Current Assignee: Jasper Design Automation, Inc.
- Current Assignee Address: US CA Mountain View
- Agency: Vista IP Law Group, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
The result of a property based formal verification analysis of a circuit design may include at least one counterexample for each property that is violated, which a user can use to debug the circuit design. To assist the user in this debugging process, a debugging tool applies one or more soft constraints to a counterexample trace that simplify the appearance of the trace when displayed as a waveform. The debugging tool thus facilitates a user's understanding of what parts of the counterexample trace are responsible for the property failure. Also described is a power analysis tool that increases the noise level of a trace for a circuit design in order to facilitate analysis of the circuit design's power characteristics.
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