Invention Grant
- Patent Title: Test support apparatus
- Patent Title (中): 测试支持设备
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Application No.: US13268165Application Date: 2011-10-07
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Publication No.: US08870172B2Publication Date: 2014-10-28
- Inventor: Meng-Bin Yu , Yang Chen , Wei Liang , Yu-Lin Liu
- Applicant: Meng-Bin Yu , Yang Chen , Wei Liang , Yu-Lin Liu
- Applicant Address: CN Wuhan TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (WuHan) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (WuHan) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Wuhan TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201110026893 20110125
- Main IPC: B23Q3/02
- IPC: B23Q3/02 ; G01M99/00 ; G01M7/02

Abstract:
A test support apparatus includes a supporting mechanism supporting a product, a holding post pressed on the product, a positioning assembly, an operating member and a clamping member. The positioning assembly is attached to the supporting mechanism and the holding post. The positioning assembly includes a positioning member and a moving member. The moving member is attached to the holding post, and moveably relative to the positioning member to adjust a distance between the holding post and the supporting mechanism. The operating member is rotatably attached to the positioning member. The clamping member is rotatably attached to the operating member and rotatable relative to the operating member about a first axis. The clamping member engaged with the supporting mechanism, and the operating member is rotatable relative to the positioning member about a second axis to rotate the clamping member about the first axis to disengaged from the supporting mechanism.
Public/Granted literature
- US20120187057A1 TEST SUPPORT APPARATUS Public/Granted day:2012-07-26
Information query
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