发明授权
- 专利标题: Generalized pattern recognition for fault diagnosis in machine condition monitoring
- 专利标题(中): 机器状态监测中故障诊断的广义模式识别
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申请号: US13494234申请日: 2012-06-12
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公开(公告)号: US08886574B2公开(公告)日: 2014-11-11
- 发明人: Chao Yuan , Amit Chakraborty , Leif Wiebking , Holger Hackstein
- 申请人: Chao Yuan , Amit Chakraborty , Leif Wiebking , Holger Hackstein
- 申请人地址: DE Munich
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: DE Munich
- 主分类号: G06F15/18
- IPC分类号: G06F15/18 ; G05B23/02 ; G06N99/00
摘要:
A generalized pattern recognition is used to identify faults in machine condition monitoring. Pattern clusters are identified in operating data. A classifier is trained using the pattern clusters in addition to annotated training data. The operating data is also used to cluster the signals in the operating data into signal clusters. Monitored data samples are then classified by evaluating confidence vectors that include substitutions of signals contained in the training data by signals in the same signal clusters as the signals contained in the training data.
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