Invention Grant
- Patent Title: Masking circuit removing unknown bit from cell in scan chain
- Patent Title (中): 掩蔽电路从扫描链中的单元去除未知位
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Application No.: US12904303Application Date: 2010-10-14
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Publication No.: US08887018B2Publication Date: 2014-11-11
- Inventor: Prakash Narayanan , Arvind Jain , Sundarrajan Subramanian , Rubin A. Parekhji
- Applicant: Prakash Narayanan , Arvind Jain , Sundarrajan Subramanian , Rubin A. Parekhji
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Lawrence J. Bassuk; Frederick J. Telecky, Jr.
- Priority: IN1625/CHE/2010 20100611
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G01R31/3185

Abstract:
Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.
Public/Granted literature
- US20110307750A1 COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROCESSES, CIRCUITS, DEVICES AND SYSTEMS Public/Granted day:2011-12-15
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