Provided is a stripe pattern image analysis device by which a burden of an appraiser regarding a new charting point searching designation operation can be reduced. The device includes a charting point modification element obtaining or modifying a first point located on a first stripe pattern image displayed in a first window, and a second point which is corresponding to the first point and located on a second stripe pattern image displayed in a second window; a nonlinear coordinate transformation element transforming the first stripe pattern image using a nonlinear coordinate transformation so that a first coordinate of the first point in the first window matches a second coordinate of the second point in the second window; and a charting figure edit and display element displaying the first stripe pattern image, transformed by the nonlinear coordinate transformation element by use of the nonlinear coordinate transformation, in the first window.