发明授权
- 专利标题: X-ray apparatus
- 专利标题(中): X光装置
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申请号: US13586241申请日: 2012-08-15
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公开(公告)号: US08897418B2公开(公告)日: 2014-11-25
- 发明人: Naoki Hasegawa
- 申请人: Naoki Hasegawa
- 申请人地址: JP Kyoto
- 专利权人: Shimadzu Corporation
- 当前专利权人: Shimadzu Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: McDermott Will & Emery LLP
- 主分类号: H05G1/64
- IPC分类号: H05G1/64 ; H04N5/32 ; G01N23/04
摘要:
An X-ray apparatus includes a pixel-extracting section for extracting pixels determined in advance in each line of an image containing a grid moiré pattern, a FFT processing section for performing one-dimensional FFT to the extracted pixels, a peak-frequency detecting section for detecting a peak frequency from a frequency characteristic for each line having undergone FTT, a frequency-characteristic preparing section for preparing a frequency characteristic for extracting the grid moiré pattern in accordance with the detected peak-frequency, an inverse FFT processing section for performing inverse FFT to the frequency characteristic prepared by the frequency-characteristic preparing section, and an FIR filtering section for performing FIR filtering on the image with use of a value calculated by the inverse FFT processing section as an FIR filter coefficient.
公开/授权文献
- US20140050300A1 X-RAY APPARATUS 公开/授权日:2014-02-20
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