发明授权
- 专利标题: Method for correcting a defect pixel
- 专利标题(中): 纠正缺陷像素的方法
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申请号: US13197811申请日: 2011-08-04
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公开(公告)号: US08897592B2公开(公告)日: 2014-11-25
- 发明人: Byoung Seok Yoo , Jae-Gwan Jeon , Bong-Ju Jun
- 申请人: Byoung Seok Yoo , Jae-Gwan Jeon , Bong-Ju Jun
- 申请人地址: KR
- 专利权人: Samsung Display Co., Ltd.
- 当前专利权人: Samsung Display Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Cantor Colburn LLP
- 优先权: KR10-2011-0031756 20110406
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G06K9/40 ; G06K9/62 ; H04N9/64 ; G06T5/00 ; H04N1/407 ; H04N1/409 ; H04N5/367 ; H04N9/04
摘要:
A method for correcting a defect pixel includes extracting a pixel value of a central pixel, and pixel values of each of a plurality of neighboring pixels around the central pixel in an image sensor by using a color filter; calculating reference levels by multiplying each the pixel value of the plurality of neighboring pixels by a weight value; calculating a total number of cases where the pixel value of the central pixel is larger or smaller than the reference level as a first comparison value or second comparison value, respectively; determining the central pixel is a defect pixel where the first or second comparison value is larger than a first or second control register value, by comparing the comparison values with the control register values, respectively; and correcting the central pixel determined as the defect pixel.
公开/授权文献
- US20120257825A1 METHOD FOR CORRECTING A DEFECT PIXEL 公开/授权日:2012-10-11
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