Invention Grant
- Patent Title: Power detector with temperature compensation
- Patent Title (中): 带温度补偿功率检测器
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Application No.: US13828714Application Date: 2013-03-14
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Publication No.: US08897727B2Publication Date: 2014-11-25
- Inventor: Xinwei Wang , Yongrong Zuo , Xiangdong Zhang , Marc Gerald DiCicco
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Michael S. Kramer
- Main IPC: H04B17/00
- IPC: H04B17/00 ; H03F3/45 ; G01R21/14 ; H03F3/24 ; H03G1/04 ; H03G3/30

Abstract:
Power detectors with temperature compensation and having improved accuracy over temperature are disclosed. In an aspect of the disclosure, variations of a power detector gain over temperature is reduced by varying both the gate and drain voltages of MOS transistors within a power detector. In an exemplary design, an apparatus includes at least one MOS transistor, which receives an input signal, detects the power of the input signal based on a power detection gain, and provides an output signal indicative of the power of the input signal. The at least one MOS transistor is applied a variable gate bias voltage and a variable drain bias voltage in order to reduce variations of the power detection gain over temperature. At least one additional MOS transistor may receive a second variable gate bias voltage and provide the variable drain bias voltage for the at least one MOS transistor.
Public/Granted literature
- US20130324062A1 POWER DETECTOR WITH TEMPERATURE COMPENSTATION Public/Granted day:2013-12-05
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