Invention Grant
- Patent Title: Backscatter system with variable size of detector array
- Patent Title (中): 具有可变尺寸检测器阵列的反向散射系统
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Application No.: US13446521Application Date: 2012-04-13
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Publication No.: US08903045B2Publication Date: 2014-12-02
- Inventor: Jeffrey R. Schubert , William Randall Cason
- Applicant: Jeffrey R. Schubert , William Randall Cason
- Applicant Address: US MA Billerica
- Assignee: American Science and Engineering, Inc.
- Current Assignee: American Science and Engineering, Inc.
- Current Assignee Address: US MA Billerica
- Agency: Sunstein Kann Murphy & Timbers LLP
- Main IPC: G01N23/203
- IPC: G01N23/203 ; G01N23/201

Abstract:
A variable-geometry backscatter inspection system has a radiation detector array including one or more backscatter radiation detectors. The position of a second backscatter radiation detector is variable with respect to the position of a first backscatter radiation detector, so that the size of the detector array may be varied by moving the second radiation detector into or out of a predefined alignment with the first radiation detector. The system may include a movable base, and at least one of the detectors is movable with respect to the base. Methods of inspecting an object include forming a detector array by moving a second radiation detector into a predefined alignment with a first radiation detector, illuminating the object with a pencil beam of penetrating radiation, and detecting backscattered radiation with the detector array.
Public/Granted literature
- US20120263276A1 Backscatter System with Variable Size of Detector Array Public/Granted day:2012-10-18
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