发明授权
- 专利标题： Methods and systems for gain calibration of gamma ray detectors
- 专利标题（中）： 伽马射线探测器增益校准的方法和系统
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申请号： US13492439申请日： 2012-06-08
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公开(公告)号： US08907290B2公开(公告)日： 2014-12-09
- 发明人: Chang Lyong Kim , David Leo McDaniel , James Lindgren Malaney , William Todd Peterson , Vi-Hoa Tran , Ashwin Ashok Wagadarikar
- 申请人： Chang Lyong Kim , David Leo McDaniel , James Lindgren Malaney , William Todd Peterson , Vi-Hoa Tran , Ashwin Ashok Wagadarikar
- 申请人地址： US NY Schenectady
- 专利权人： General Electric Company
- 当前专利权人： General Electric Company
- 当前专利权人地址： US NY Schenectady
- 代理机构： The Small Patent Law Group
- 代理商 Dean D. Small
- 主分类号： G01T1/24
- IPC分类号： G01T1/24
摘要：
A method for gain calibration of a gamma ray detector includes measuring signals generated by one or more light sensors of a gamma ray detector, generating one or more derived curves using the measured signals as a function of bias voltage and identifying a transition point in the one or more derived curves. The method also includes determining a breakdown voltage of the one or more light sensors using the identified transition point and setting a bias of the one or more light sensors based on the determined breakdown voltage.