Invention Grant
- Patent Title: X-ray detector
- Patent Title (中): X射线探测器
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Application No.: US14084878Application Date: 2013-11-20
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Publication No.: US08907339B2Publication Date: 2014-12-09
- Inventor: Chih-Hao Wu
- Applicant: InnoLux Corporation
- Applicant Address: TW Miao-Li County
- Assignee: InnoLux Corporation
- Current Assignee: InnoLux Corporation
- Current Assignee Address: TW Miao-Li County
- Agency: Bacon & Thomas, PLLC
- Priority: TW101145295A 20121203
- Main IPC: H01L29/12
- IPC: H01L29/12 ; H01L27/12 ; H01L31/08

Abstract:
An X-ray detector including a thin film transistor (TFT) substrate and a photo-diode array layer is disclosed. Each thin film transistor in the TFT substrate includes: a substrate; a gate-electrode on the substrate; a gate insulating layer on the gate-electrode; a semiconductor layer on the gate insulating layer, wherein a portion of the semiconductor layer covers the gate-electrode; an etching stop layer covering the semiconductor layer; a source-electrode and a drain-electrode respectively disposed on the etching stop layer, wherein the source-electrode and the drain-electrode are respectively electrically connected to the semiconductor layer through conductive via-holes each having a base portion at the semiconductor layer, and at least one of the projection areas of the base portions vertically projected on the substrate has a non-overlapping region beyond the projection area of the gate-electrode vertically projected on the substrate; and a passivation layer covering the source-electrode and the drain-electrode.
Public/Granted literature
- US20140151684A1 X-RAY DETECTOR Public/Granted day:2014-06-05
Information query
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