发明授权
US08924786B2 No-touch stress testing of memory I/O interfaces 有权
内存I / O接口的无接触压力测试

No-touch stress testing of memory I/O interfaces
摘要:
Embodiments are generally directed no-touch stress testing of memory input/output (I/O) interfaces. An embodiment of a memory device includes a system element to be coupled with a dynamic random-access memory (DRAM), the system element including a memory interface for connection with the DRAM, the interface including a driver and a receiver, a memory controller for control of the DRAM, and a timing stress testing logic for testing of the I/O interface.
公开/授权文献
信息查询
0/0