Invention Grant
- Patent Title: Apparatus for analyzing sample
- Patent Title (中): 用于分析样品的仪器
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Application No.: US13007192Application Date: 2011-01-14
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Publication No.: US08932538B2Publication Date: 2015-01-13
- Inventor: Hyun Min Kim , Do Gyoon Kim , Jong Myeon Park
- Applicant: Hyun Min Kim , Do Gyoon Kim , Jong Myeon Park
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2010-0004092 20100115
- Main IPC: G01N33/00
- IPC: G01N33/00 ; B01L3/00

Abstract:
A apparatus for analyzing sample to prevent a sample from being stuck to a surface of the apparatus for analyzing sample in the course of being injected into the apparatus for analyzing sample. The apparatus for analyzing sample includes a platform having a disk shape. The platform includes chambers and channels, a sample inlet hole which is formed in an outer surface the platform and through which a sample is injected into the platform; an opening which is formed in the outer surface of the platform and through which a residual of the sample, present on the outer surface of the platform around the sample inlet hole, is introduced into a receiving space isolated from the chambers and channels; and a barrier which is formed on the outer surface of the platform around a portion of the opening to prevent the residual of the sample from moving past the opening in a radial outward direction of the platform.
Public/Granted literature
- US20110176963A1 APPARATUS FOR ANALYZING SAMPLE Public/Granted day:2011-07-21
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