Invention Grant
- Patent Title: Systems and methods for facilitating use of a universal test connection for a plurality of different devices
- Patent Title (中): 用于促进对多个不同装置使用通用测试连接的系统和方法
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Application No.: US11864235Application Date: 2007-09-28
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Publication No.: US08933703B2Publication Date: 2015-01-13
- Inventor: David Henderson , Sean P. Cortright , Calvin Krug , Ryan Kelley
- Applicant: David Henderson , Sean P. Cortright , Calvin Krug , Ryan Kelley
- Applicant Address: US CA Santa Rosa
- Assignee: Keysight Technologies, Inc.
- Current Assignee: Keysight Technologies, Inc.
- Current Assignee Address: US CA Santa Rosa
- Main IPC: H01H31/02
- IPC: H01H31/02

Abstract:
A module is used for interfacing between a particular device to be tested (DUT) and a test station having a universal set of connections. The module is adapted for bridging both the physical and electrical differences between connection points available on the DUT and the universal test connections. The module contains information (personality data) unique to the particular DUT and is designed to mount in a tray in which the DUT is positioned. The personality module resides partially within an environmentally controlled area and an area outside of the environmentally controlled area and is adapted to seal the environmentally controlled area so as to maintain testing integrity therein. In one embodiment, the connections between the module and the test station occur outside of the environmentally controlled area.
Public/Granted literature
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