Invention Grant
- Patent Title: Apparatus for measuring frequency change of an oscillator
- Patent Title (中): 用于测量振荡器频率变化的装置
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Application No.: US13405581Application Date: 2012-02-27
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Publication No.: US08933706B1Publication Date: 2015-01-13
- Inventor: Richard K. Karlquist
- Applicant: Richard K. Karlquist
- Applicant Address: US CA Santa Rosa
- Assignee: Keysight Technologioes, Inc.
- Current Assignee: Keysight Technologioes, Inc.
- Current Assignee Address: US CA Santa Rosa
- Main IPC: G01R27/04
- IPC: G01R27/04

Abstract:
An apparatus comprises: a first oscillator; a second oscillator; a first frequency synthesizer configured to receive a first input from the first oscillator and to provide a scaled first output frequency based on the first input; a second frequency synthesizer configured to receive a second input from the second oscillator and to provide a scaled second output frequency based on the second input; a mixer configured to receive the scaled first output frequency and the scaled second output frequency and to output a difference between the scaled first output frequency and the scaled second output frequency; and a processor configured to determine a change in an output frequency of the first oscillator based on the difference. The change in the output frequency provides an indication of a change in a measurement parameter.
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