Invention Grant
US08935811B2 Vertically mounted sample stage for microscopy and scanning probe microscope using the sample stage
有权
垂直安装的样品台用于显微镜和扫描探针显微镜,使用样品台
- Patent Title: Vertically mounted sample stage for microscopy and scanning probe microscope using the sample stage
- Patent Title (中): 垂直安装的样品台用于显微镜和扫描探针显微镜,使用样品台
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Application No.: US14135710Application Date: 2013-12-20
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Publication No.: US08935811B2Publication Date: 2015-01-13
- Inventor: Hwan-soo Suh
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2012-0149757 20121220
- Main IPC: G01Q30/20
- IPC: G01Q30/20 ; B82Y35/00

Abstract:
A sample stage for microscopy includes a sample holder including a body in which a sample-mounting part and a seating part are provided on a bottom of the body and a grip part for a mounting unit is provided on a top of the body, a sample rack, on which the sample holder is mounted, including a supporter supporting the seating part of the sample holder, and an elastic element provided on the sample rack, providing the sample holder with a pressing force inclined with respect to a vertical direction and fastening the sample holder to the sample rack while the seating part is being supported by the supporter. The sample stage may be vertically mounted.
Public/Granted literature
- US20140182020A1 VERTICALLY MOUNTED SAMPLE STAGE FOR MICROSCOPY AND SCANNING PROBE MICROSCOPE USING THE SAMPLE STAGE Public/Granted day:2014-06-26
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