Invention Grant
US08935811B2 Vertically mounted sample stage for microscopy and scanning probe microscope using the sample stage 有权
垂直安装的样品台用于显微镜和扫描探针显微镜,使用样品台

Vertically mounted sample stage for microscopy and scanning probe microscope using the sample stage
Abstract:
A sample stage for microscopy includes a sample holder including a body in which a sample-mounting part and a seating part are provided on a bottom of the body and a grip part for a mounting unit is provided on a top of the body, a sample rack, on which the sample holder is mounted, including a supporter supporting the seating part of the sample holder, and an elastic element provided on the sample rack, providing the sample holder with a pressing force inclined with respect to a vertical direction and fastening the sample holder to the sample rack while the seating part is being supported by the supporter. The sample stage may be vertically mounted.
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