Disclosed is an LCD device having a structure such as a column inversion type or a Z-inversion type where a single data line can be shared by two neighboring pixels, and an inspection circuit and method thereof. The inspection circuit for outputting gate driving signals in a division manner into odd and even-numbered signals is provided between the gate driving unit and a pixel region, so that only color pixels to be inspected can be driven. This can allow pixels to be normally inspected in an LCD device having an enhanced column inversion structure.