发明授权
- 专利标题: Soft field tomography system and method
- 专利标题(中): 软磁场断层扫描系统及方法
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申请号: US13316514申请日: 2011-12-11
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公开(公告)号: US08942787B2公开(公告)日: 2015-01-27
- 发明人: Wei Tan , Alexander Seth Ross , Veera Venkata Lakshmi Rajesh Langoju , Ran Niu , Zhilin Wu , Weihua Gao
- 申请人: Wei Tan , Alexander Seth Ross , Veera Venkata Lakshmi Rajesh Langoju , Ran Niu , Zhilin Wu , Weihua Gao
- 申请人地址: US NY Schenectady
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Schenectady
- 代理机构: GE Global Patent Operation
- 代理商 Marc A. Vivenzio
- 优先权: CN201010612087 20101229
- 主分类号: A61B5/05
- IPC分类号: A61B5/05
摘要:
An iteration method for computing a distribution of one or more properties within an object comprises defining a first mesh of the object, applying an excitation to the object, computing a response of the object to the applied excitation, obtaining a reference response of the object corresponding to the applied excitation, computing a distribution of one or more properties of the object, and updating at least a subset of the nodes of the first mesh to form an updated mesh of the object. The distribution of one or more properties of the object is computed using the computed response, the reference response, and the first mesh. The first mesh includes a plurality of nodes and elements. A connectivity relationship of the subset of the nodes in the updated mesh remains the same as in the first mesh.
公开/授权文献
- US20120172719A1 SOFT FIELD TOMOGRAPHY SYSTEM AND METHOD 公开/授权日:2012-07-05