发明授权
US08953729B1 Method for symbol sampling in a high time delay spread interference environment
有权
在高时延延迟扩散干扰环境中进行符号采样的方法
- 专利标题: Method for symbol sampling in a high time delay spread interference environment
- 专利标题(中): 在高时延延迟扩散干扰环境中进行符号采样的方法
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申请号: US14016273申请日: 2013-09-03
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公开(公告)号: US08953729B1公开(公告)日: 2015-02-10
- 发明人: Mac L. Hartless , Richard D. Taylor , Steve R. Wynn
- 申请人: Harris Corporation
- 申请人地址: US FL Melbourne
- 专利权人: Harris Corporation
- 当前专利权人: Harris Corporation
- 当前专利权人地址: US FL Melbourne
- 代理机构: Fox Rothschild LLP
- 代理商 Robert J. Sacco, Esq.
- 主分类号: H04L7/00
- IPC分类号: H04L7/00
摘要:
Symbol sampling in a high time delay spread interference environment includes acquiring (602) a time varying baseband waveform. The waveform has a signal amplitude that varies between one of a plurality of symbol states. The waveform is sampled (603) at a rate of m times the symbol rate. During an evaluation time, an error value is calculated (604, 606) for each of m data sample positions. Each of the error values comprises an average distance between the measured value of the waveform as indicated by the data sample and a closest known symbol value. The error values are used to create an error surface. Thereafter, the error surface is modeled as a quadratic and an optimal sample time is determined (608, 610, 612) based on finding the time location where the quadratic surface is minimum. A sinc interpolator is then used to resample the data.
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