发明授权
- 专利标题： Universal test system for testing electrical and optical hosts
- 专利标题（中）： 电子和光学主机测试通用测试系统
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申请号： US13335661申请日： 2011-12-22
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公开(公告)号： US08963573B2公开(公告)日： 2015-02-24
- 发明人: D. Brice Achkir , Marco Mazzini , Stefano Riboldi , Cristiana Muzio
- 申请人： D. Brice Achkir , Marco Mazzini , Stefano Riboldi , Cristiana Muzio
- 申请人地址： US CA San Jose
- 专利权人： Cisco Technology, Inc.
- 当前专利权人： Cisco Technology, Inc.
- 当前专利权人地址： US CA San Jose
- 主分类号： G01R31/00
- IPC分类号： G01R31/00 ; G01R1/067 ; H04L1/24 ; G01R31/3185
摘要：
According to an example implementation, a universal tester includes a host interface slot connected to a first pluggable host card during an electrical test mode of operation to provide a stressed electrical signal to a host under test. The host interface slot is connected to a second pluggable host card during an optical test mode of operation, the second pluggable host card including an electrical-optical conversion block to convert a stressed electrical signal to a stressed optical signal that is provided to a host under test. A stressor generator may operation in pass-through mode or a loop-back mode.
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