Invention Grant
- Patent Title: Memory error identification based on corrupted symbol patterns
- Patent Title (中): 基于损坏的符号模式的内存错误识别
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Application No.: US13689814Application Date: 2012-11-30
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Publication No.: US08966348B2Publication Date: 2015-02-24
- Inventor: Doe Hyun Yoon , Jichuan Chang , Naveen Muralimanohar
- Applicant: Hewlett-Packard Development Company, L.P.
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Agency: Hewlett-Packard Patent Department
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A system includes a memory controller, a buffer, a first channel to couple the memory controller to the buffer, and a second channel to couple the buffer to a memory. The first channel and second channel are to transmit a codeword including a plurality of symbols. A symbol is formed from a plurality of bursts based on data access of the memory. The memory controller is to identify a memory error based on a corrupted symbol pattern of the codeword. The memory controller is to discriminate between a chip failure, a first pin failure of the first channel, and a second pin failure of the second channel, as being a type of the memory error, according to the corrupted symbol pattern.
Public/Granted literature
- US20140157054A1 MEMORY ERROR IDENTIFICATION BASED ON CORRUPTED SYMBOL PATTERNS Public/Granted day:2014-06-05
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