Invention Grant
- Patent Title: Systems and methods for calibrating mass spectrometers
- Patent Title (中): 用于校准质谱仪的系统和方法
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Application No.: US13794779Application Date: 2013-03-11
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Publication No.: US08975573B2Publication Date: 2015-03-10
- Inventor: David Rafferty , James Wylde , Michael Spencer , Warren Mino
- Applicant: 1st Detect Corporation
- Applicant Address: US TX Austin
- Assignee: 1st Detect Corporation
- Current Assignee: 1st Detect Corporation
- Current Assignee Address: US TX Austin
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner LLP
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
Systems and methods are disclosed for calibrating mass spectrometers. In accordance with one implementation, a system comprises a calibrant chamber within a housing of a mass spectrometer. The system also comprises a permeation tube enclosed within the calibrant chamber, wherein the tube contains a calibrant chemical that continuously outgasses the calibrant chemical. The outgassed calibrant chemical may be introduced to the mass spectrometer for analysis. The system may also comprise a heating block to control the temperature of the calibrant chemical. The system may further comprise a valve that introduces a known amount of the calibrant chemical into the calibrant chamber. In accordance with the present disclosure, systems and methods are provided for calibrating a mass spectrometer abundance scale.
Public/Granted literature
- US20140252215A1 SYSTEMS AND METHODS FOR CALIBRATING MASS SPECTROMETERS Public/Granted day:2014-09-11
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