Invention Grant
US08977052B2 Apparatus and method for detecting error in lesion contour, apparatus and method for correcting error in lesion contour, and apparatus for inspecting error in lesion contour
有权
用于检测损伤轮廓误差的装置和方法，用于校正病变轮廓误差的装置和方法，以及用于检查病变轮廓误差的装置
- Patent Title: Apparatus and method for detecting error in lesion contour, apparatus and method for correcting error in lesion contour, and apparatus for inspecting error in lesion contour
- Patent Title (中): 用于检测损伤轮廓误差的装置和方法，用于校正病变轮廓误差的装置和方法，以及用于检查病变轮廓误差的装置
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Application No.: US13668068Application Date: 2012-11-02
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Publication No.: US08977052B2Publication Date: 2015-03-10
- Inventor: Chu-Ho Chang , Yeong-Kyeong Seong , Moon-Ho Park
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR10-2011-0114143 20111103
- Main IPC: G06K9/34
- IPC: G06K9/34 ; G06K9/00 ; G06K9/46 ; G06T7/00
Abstract:
An apparatus for detecting an error in a contour of a lesion includes an extracting unit configured to extract a contour of a lesion in each of a plurality of two-dimensional image frames that form a three-dimensional image, and an error determining unit configured to determine a presence or an absence of an error in a contour of a lesion in a target image frame of the two-dimensional image frames based on estimation information about the lesion in the target image frame and/or an energy value that corresponds to the contour of the lesion in the target image frame.
Public/Granted literature
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