Invention Grant
- Patent Title: High resolution temperature measurement
- Patent Title (中): 高分辨率温度测量
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Application No.: US13658026Application Date: 2012-10-23
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Publication No.: US08985849B2Publication Date: 2015-03-24
- Inventor: Darren Edward Noel Wenn , James E. Bartling
- Applicant: Microchip Technology Incorporated
- Applicant Address: US AZ Chandler
- Assignee: Microchip Technology Incorporated
- Current Assignee: Microchip Technology Incorporated
- Current Assignee Address: US AZ Chandler
- Agency: King & Spalding L.L.P.
- Main IPC: G01K7/16
- IPC: G01K7/16 ; G01K3/10 ; G01K7/34 ; G01K7/22

Abstract:
Temperature is determined by measuring the time it takes to charge a capacitor with a resistive temperature sensor. A clock, time counter, a voltage comparator and voltage reference are used in determining a coarse time measurement. The time measurement resolution is enhanced with the addition of a constant current source charging another timing capacitor within a single clock pulse time to provide a fine time measurement.
Public/Granted literature
- US20130121372A1 HIGH RESOLUTION TEMPERATURE MEASUREMENT Public/Granted day:2013-05-16
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