Invention Grant
- Patent Title: Multiple contact probes
- Patent Title (中): 多个接触探针
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Application No.: US12880808Application Date: 2010-09-13
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Publication No.: US08988091B2Publication Date: 2015-03-24
- Inventor: January Kister
- Applicant: January Kister
- Applicant Address: US CA Carlsbad
- Assignee: MicroProbe, Inc.
- Current Assignee: MicroProbe, Inc.
- Current Assignee Address: US CA Carlsbad
- Agency: Peacock Myers, P.C.
- Agent Deborah A. Peacock; Philip D. Askenazy
- Main IPC: G01R1/067
- IPC: G01R1/067
Abstract:
The present invention is a probe array for testing an electrical device under test comprising one or more ground/power probes and one or more signal probes and optionally a gas flow apparatus.
Public/Granted literature
- US20110062978A1 MULTIPLE CONTACT PROBES Public/Granted day:2011-03-17
Information query
