Invention Grant
US08989736B2 Methods and apparatuses for determining reselection parameters for detected cells
有权
用于确定检测到的细胞的重选参数的方法和装置
- Patent Title: Methods and apparatuses for determining reselection parameters for detected cells
- Patent Title (中): 用于确定检测到的细胞的重选参数的方法和装置
-
Application No.: US13786681Application Date: 2013-03-06
-
Publication No.: US08989736B2Publication Date: 2015-03-24
- Inventor: Fan Wang , An-Swol C. Hu , Sundaresan Tambaram Kailasam , Uzma Khan
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Darren M. Simon
- Main IPC: H04W4/00
- IPC: H04W4/00 ; H04W36/16 ; H04W36/00
Abstract:
The present disclosure presents a method and apparatus for determining reselection parameters for detected cells. For example, the method may include receiving system information block (SIB) data associated with one or more cells in a neighbor cell list (NCL). In such example, the SIB data may include a ranking offset parameter associated with each of the NCL cells. Furthermore, such an example method may include detecting a cell that is not in the NCL, determining a reselection ranking value associated with each of the NCL cells, the detected cell and the serving cell. In addition, in some examples, such method may include ranking the one or more NCL cells, the detected cell and the serving cell in a ranking list based on the reselection ranking values. As such, reselection parameters for detected cells may be determined.
Public/Granted literature
- US20140038597A1 METHODS AND APPARATUSES FOR DETERMINING RESELECTION PARAMETERS FOR DETECTED CELLS Public/Granted day:2014-02-06
Information query
